Skip to content
This repository has been archived by the owner on Jun 4, 2023. It is now read-only.

Latest commit

 

History

History
40 lines (31 loc) · 2.1 KB

README.md

File metadata and controls

40 lines (31 loc) · 2.1 KB
Raw

Defect Sampling (DS)

Introduction

Defect Sampling (DS) is a university project. This project is an attempt to detect the surface defects on a steel strip from it's image.

For now, we are using Singular Value Decomposition (SVD) to extract the features from the image. The left singular vectors and right singluar vector are used to produce the left and right projections of the image. The projections are used to determine the potential defects in the image.

Tools

  • Front End: The project is made using different open source tools. The front end of the application is written in dart language which used flutter framework. The flutter compiles the dart code into native C++ code which make the application fast and light.
  • Back End: The backend is written in .Net C#. The backend uses LAPACK under the hood for performing matrix calculation in low level memory. C# makes the backend very light and fast.

Installation

You can download the ds_setup (recommended) or ds_portable.zip (portable zip) file from releases. The bugs are recommended to report on issues

Note Extract the zip file and place the contained files in the desired installation location. (for example, C:\src\ds_portable).

Warning Do not extract ds_portable to a path that contains special characters or spaces.

Warning Do not extract ds_portable in a directory like C:\Program Files\ that requires elevated privileges.

Preview

The following images used in preview are taken as screenshots. The system specification is as mentioned.

  • Windows 10
  • System Theme (Dark Theme)
  • Solid Windows Transparency
  • System Accent Color capture capture capture